- Manufacturer:
-
- Texas Instruments (387)
- Analog Devices, Inc. (29)
- Diodes Incorporated (12)
- Microchip Technology (287)
- Nexperia (26)
- Intel (2)
- Intersil (2)
- LSI/CSI (2)
- Motorola (3)
- NXP Semiconductors (128)
- onsemi (268)
- Product Status:
-
- Operating Temperature:
-
- Package / Case:
-
- Supplier Device Package:
-
- Supply Voltage:
-
- Number of Bits:
-
- Logic Type:
-
1,393 Records
Image | Part | Manufacturer | Description | Factory Lead Time | Stock | Action | |
---|---|---|---|---|---|---|---|
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NXP Semiconductors | IC BUFFER 1.8V 28BI... |
1-3 days |
7,894
In-stock
|
View details Get Quote | ||
![]() |
NXP Semiconductors | IC BUFFER 1.8V 28BI... |
1-3 days |
8,193
In-stock
|
View details Get Quote | ||
![]() |
National Semiconductor | LOOK-AHEAD CARRY... |
1-3 days |
1,044
In-stock
|
View details Get Quote | ||
![]() |
Texas Instruments | IC SCAN-TEST-DEV/... |
1-3 days |
8,732
In-stock
|
View details Get Quote | ||
![]() |
NXP Semiconductors | IC BUFFER 1.8V 28BI... |
1-3 days |
5,378
In-stock
|
View details Get Quote | ||
![]() |
Texas Instruments | IC SCAN-TEST-DEV/... |
1-3 days |
261
In-stock
|
View details Get Quote | ||
![]() |
National Semiconductor | ALU, F/FAST SERIE... |
1-3 days |
183
In-stock
|
View details Get Quote | ||
![]() |
Texas Instruments | IC CONFIG REG BUF... |
1-3 days |
6,697
In-stock
|
View details Get Quote | ||
![]() |
NXP Semiconductors | IC BUFFER 1.8V 28BI... |
1-3 days |
7,173
In-stock
|
View details Get Quote | ||
![]() |
Texas Instruments | IC SCAN TEST DEV/... |
1-3 days |
40
In-stock
|
View details Get Quote | ||
![]() |
Texas Instruments | IC SCAN-TEST-DEV/... |
1-3 days |
6,681
In-stock
|
View details Get Quote | ||
![]() |
NXP Semiconductors | IC BUFFER 1.8V 28BI... |
1-3 days |
9,683
In-stock
|
View details Get Quote | ||
![]() |
Texas Instruments | IC BUFF CONFIG RE... |
1-3 days |
6,309
In-stock
|
View details Get Quote | ||
![]() |
NXP Semiconductors | IC BUFFER 1.8V 25BI... |
1-3 days |
8,934
In-stock
|
View details Get Quote | ||
![]() |
Texas Instruments | IC SCAN-TEST-DEV/... |
1-3 days |
8,861
In-stock
|
View details Get Quote | ||
![]() |
NXP Semiconductors | IC BUFFER 1.8V 25BI... |
1-3 days |
5,390
In-stock
|
View details Get Quote | ||
![]() |
National Semiconductor | ALU, 100K SERIES |
1-3 days |
265
In-stock
|
View details Get Quote | ||
![]() |
Texas Instruments | IC 10-BIT SCAN POR... |
1-3 days |
7,266
In-stock
|
View details Get Quote | ||
![]() |
NXP Semiconductors | IC BUFFER 1.8V 25BI... |
1-3 days |
7,439
In-stock
|
View details Get Quote | ||
![]() |
Texas Instruments | IC SCAN-TEST-DEV/... |
1-3 days |
31
In-stock
|
View details Get Quote |